Ade Corp. v. KLA-Tencor Corp.
District Court, D. Delaware
1Opinion of the Court
AMENDED MEMORANDUM OPINION
THYNGE, United States Magistrate Judge.
Plaintiff, ADE Corporation (“ADE”), and defendant, KLA-Tencor Corporation (“KLA”), are owners of patents directed to the detection and classification of defects on the surface of silicon wafers as crystalline originated pit (“COP”) defects or particle defects. On October 10, 2000, ADE filed this patent infringement suit against KLA alleging infringement of its 6,118,525 patent. D.I. 1. KLA counterclaimed arguing that ADE infringed its 5,883,710; 6,215,551; 6,081,325; and 5,226,118 pat ents. 1 Pursuant to Markman v. Westview…
2Cases cited58 opinions
- Anderson v. Liberty Lobby, Inc.Supreme Court of the United States · 1986
- Celotex Corp. v. Catrett, Administratrix of the Estate of CatrettSupreme Court of the United States · 1986
- Matsushita Electric Industrial Co., Ltd. v. Zenith Radio CorporationSupreme Court of the United States · 1986
- Graham v. John Deere Co. of Kansas CitySupreme Court of the United States · 1966
- MARKMAN Et Al. v. WESTVIEW INSTRUMENTS, INC., Et Al.Supreme Court of the United States · 1996
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3Cited by3 opinions
- ADE CORP. v. KLA-Tencor Corp.District Court, D. Delaware · 2003
- Tulip Computers, Internationali B v. v. Dell Computer Corp.District Court, D. Delaware · 2002
- Ade Corp. v. KLA-Tencor Corp.District Court, D. Delaware · 2003