ADE CORP. v. KLA-Tencor Corp.
District Court, D. Delaware
1Opinion of the Court
OPINION
JORDAN, District Judge.
I. INTRODUCTION
This matter is before the Court for construction of the claims in U.S. Patent No. 6,292,259 B1 (issued Sept. 18, 2001) (the “ ’259 patent”), pursuant to Markman v. Westview Instruments, Inc., 52 F.3d 967 (Fed.Cir.1995) (en banc), aff’d, 517 U.S. 370, 116 S.Ct. 1384, 134 L.Ed.2d 577 (1996). Plaintiff ADE Corporation (“ADE”) and defendant KLA-Tencor Corporation (“KLA”) own United States patents used in the silicon wafer inspection industry to detect and classify silicon wafer surface defects as either crystalline originated pit defects or particle…
2Cases cited27 opinions
- MARKMAN Et Al. v. WESTVIEW INSTRUMENTS, INC., Et Al.Supreme Court of the United States · 1996
- Herbert Markman and Positek, Inc. v. Westview Instruments, Inc. And Althon Enterprises, Inc.Court of Appeals for the Federal Circuit · 1995
- Vitronics Corporation v. Conceptronic, Inc.Court of Appeals for the Federal Circuit · 1996
- Cybor Corporation v. Fas Technologies, Inc., and Fastar Ltd., Defendants-CrossCourt of Appeals for the Federal Circuit · 1998
- Sri International v. Matsushita Electric Corporation of America and Matsushita Electric Industrial Co., Ltd.Court of Appeals for the Federal Circuit · 1985
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