Nova Measuring Instruments Ltd. v. Nanometrics, Inc.
District Court, N.D. California
1Opinion of the Court
THIRD DISCOVERY ORDER
ZIMMERMAN, United States Magistrate Judge.
Before the court is plaintiff Nova Measuring Instruments’ motion to compel defendant Nanometrics’ production of documents pursuant to Patent L.R. 3-4. The parties disagree (1) whether the documents produced must be in their native file format, with original metadata, and (2) whether the documents produced are sufficient to show the operation of each aspect or element of the claims identified in Nova’s Patent L.R. 3-l(c) chart. Based on the papers submitted by both parties, I have decided that there is no need for further argument.…
2Cases cited2 opinions
- In re Honeywell International, Inc.District Court, S.D. New York · 2003
- Integrated Circuit Systems, Inc. v. Realtek Semiconductor Co.District Court, N.D. California · 2004
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- O2 Micro International, Ltd. v. Monolithic Power Systems, Inc.Court of Appeals for the Federal Circuit · 2006
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