Electronic Arrays, Inc. v. United States

Memorandum Opinion and Order

Watson, Judge:

This action challenged the tariff classification of imported articles which are used to inspect the quality of semiconductor devices while they are being manufactured. The articles consist of transport mechanisms, which move the semiconductors, and *724microscopes which are screwed on to a rod extending from the transport mechanism.

One type of importation is called a bonding checker, and it is used to inspect the semiconductor device just before it is encapsulated. The bonding checker inspects the bonding wires which form the electrical connection between…