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Fast Construction of Test-Program Generators for Digital Signal Processors

Jan 1, 1999 · 4 authors · 5 topics

Test-program generators play a key role in hardware functional verification of large scale processors. However, in the DSP domain, the usage of full-blown test-program generators is much less popular, mainly due to the limited resources (time and money) available when developing such systems. This paper describes a work-model for the fast, low cost construction of a test-program generator for DSPs. The core technology uses Genesys, a known test program generator that, until now, has been used for the verification of large scale processor families, such as PowerPC and x86. We developed the model while using Genesys for verification of the IBM C54XDSP, a recently-announced fixedpoint DSP. The case study shows that it is possible to build a full test-program generator in a very short time and thus achieve better verification coverage in spite of the shorter development time.

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Shai Rubin MosheMoshe Levinger RAll R. PrattWilliam P. Moore
VLSI and Analog Circuit TestingSoftware Testing and Debugging TechniquesFormal Methods in VerificationPowerPCComputer science
PublishedJan 1, 1999
TypeArticle
Citations0

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