Abstract
We report the construction of a sensitive electro-optic sampling system for the measurement of ultrafast electrical transients. This system has a temporal resolution of lessthan 4 ps (over 100- GHz bandwidth), better than 50-μV sensitivity and potential for a temporal resolution reaching the single picosecond. Demonstrated applications are ultrafast photodetector response characterization and time resolved photoconductivity.
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Authors
Janis A. ValdmanisGerard A. MourouC. W. Gabel
Topics
Integrated Circuits and Semiconductor Failure AnalysisPhotonic and Optical DevicesAdvanced Optical Sensing Technologies
About
PublishedAug 1, 1982
TypeArticle
Citations358
References11